直径公差：25.4 mm+0/-0.2 mm，75.0和100.0 mm+0/-0.3 mm
厚度公差：+/-0.2 mm
表面光洁度：S&D 60/40
CA:90%中心
光谱测量
每个窗口提供室温和法向入射角下的光谱曲线。
非标准光谱测量（1-4个）
| Art no | Description | Substrate | min Tavg % |
| 716.700.640 | BBAR-3000-5000 nm Ø25.4×0.5 mm | Si | 97% |
| 716.700.641 | BBAR-3000-5000 nm Ø25.4×1.0 mm | Si | 97% |
| 716.700.642 | BBAR-3000-5000 nm Ø100.0×0.5 mm | Si | 97% |
| 716.700.643 | BBAR-3000-5000 nm Ø100.0×1.0 mm | Si | 97% |
| 716.700.650 | BBAR-8000-12000 nm Ø25.4×0.5 mm | Si | 88% |
| 716.700.651 | BBAR-8000-12000 nm Ø25.4×1.0 mm | Si | 88% |
| 716.700.652 | BBAR-8000-12000 nm Ø100.0×0.5 mm | Si | 88% |
| 716.700.653 | BBAR-8000-12000 nm Ø100.0×1.0 mm | Si | 88% |
| 716.700.660 | BBAR-2500-14000 nm Ø25.4×0.5 mm | Si | 3-5 µm 90 % 8-12 µm 80 % |
| 716.700.661 | BBAR-2500-14000 nm Ø25.4×1.0 mm | Si | 3-5 µm 90 % 8-12 µm 80 % |
| 716.700.662 | BBAR-2500-14000 nm Ø100.0×0.5 mm | Si | 3-5 µm 90 % 8-12 µm 80 % |
| 716.700.663 | BBAR-2500-14000 nm Ø100.0×1.0 mm | Si | 3-5 µm 90 % 8-12 µm 80 % |