Silicon Drift Detector (SDD) Multi Cell SDDs The Unique Rococo Detector – a monolithic annular 4-channel SDD for XRF and EDX 用于XRF和EDX的单片环形4通道SDD
When extreme solid angles are needed to detect the most available signal, the Rococo2 and Rococo3 detectors are the best choice you can make.
Due to their special geometry, these monolithic annular 4-channel SDDs with the exciting beam through the hole in the middle of the chip can be placed extremely close to the sample, resulting in huge solid angle values up to 1.8 sr, and in a tremendous reduction of measurement time. At the same time, the annular detector geometry makes possible a 3D-visualisation of the sample without any shadowing effects.
当需要极端立体角来检测最可用的信号时，Rococo2和Rococo3探测器是您的最佳选择。
由于其特殊的几何形状，这些具有通过芯片中间孔的激励光束的单片环形4通道SDD可以放置在非常靠近样品的位置，从而产生高达1.8sr的巨大立体角值，并大大缩短了测量时间。同时，环形探测器的几何形状使样品的3D可视化成为可能，而没有任何阴影效应。
Annular SDDs with a Huge Solid Angle
Huge solid angles up to 1.8 sr
Energy resolution down to 125 eV @ Mn-Kα
High count rate capability up to 4 Mcps (ICR)
Fast analysis of sensitive samples in XRF-systems and synchrotron applications
SEM-EDX analysis with highest sensitivity
大立体角环形SDD
高达1.8sr的巨大立体角
能量分辨率低至125 eV@Mn-Kα
高计数率能力高达4 Mcps（ICR）
XRF系统中敏感样品的快速分析及同步加速器应用
灵敏度最高的SEM-EDX分析
Particulary advantageous in SEM-EDX
EDX mappings with high-quality statistics can be performed in seconds
Many times more signal compared to measurements with conventional SDDs
Unmatched sensitivity up to 1 kcps / pA primary beam current
Light-element sensitivity down to Beryllium
No shading by sample topography
Fast XRF elemental mapping
High collection efficiency leading to substantial reduction of the measurement time
Light-proof version for light sensitive experiments (e.g. involving a light microscope)
Fast analysis of biological samples at synchrotron nano-beam lines
Increased sensitivity for trace element analysis in PIXE experiments
