{"id":84,"date":"2019-01-18T15:35:44","date_gmt":"2019-01-18T07:35:44","guid":{"rendered":"https:\/\/www.bihec.com\/idonus\/?p=84"},"modified":"2019-09-21T10:08:08","modified_gmt":"2019-09-21T02:08:08","slug":"%e7%91%9e%e5%a3%abidonus%e6%99%b6%e5%9c%86%e9%94%ae%e5%90%88%e6%a3%80%e6%b5%8b%e6%9c%ba","status":"publish","type":"post","link":"https:\/\/www.bihec.com\/idonus\/%e7%91%9e%e5%a3%abidonus%e6%99%b6%e5%9c%86%e9%94%ae%e5%90%88%e6%a3%80%e6%b5%8b%e6%9c%ba\/","title":{"rendered":"\u745e\u58ebIdonus\u6676\u5706\u952e\u5408\u68c0\u6d4b\u673a"},"content":{"rendered":"<p>Wafer bonding inspection device<br \/>\n[pdfjs-viewer url=&#8221;https:\/\/www.bihec.com\/idonus\/wp-content\/uploads\/sites\/55\/2019\/01\/\u6676\u5706\u952e\u5408\u68c0\u6d4b\u673a.pdf&#8221; viewer_width=100% viewer_height=1360px fullscreen=true download=true print=true]<\/p>\n<br><div class=\"tagcloud\"><a href=\"https:\/\/www.bihec.com\/idonus\/tag\/idonus\/\" class=\"tag-cloud-link tag-link-0 tag-link-position-1\" style=\"font-size: 22pt;\" aria-label=\"idonus (70\u4e2a\u9879\u76ee)\">idonus<\/a>\n<a href=\"https:\/\/www.bihec.com\/idonus\/tag\/mems%e9%80%a0%e8%ae%be%e5%a4%87\/\" class=\"tag-cloud-link tag-link-1 tag-link-position-2\" style=\"font-size: 20.554838709677pt;\" aria-label=\"MEMS\u9020\u8bbe\u5907 (48\u4e2a\u9879\u76ee)\">MEMS\u9020\u8bbe\u5907<\/a>\n<a href=\"https:\/\/www.bihec.com\/idonus\/tag\/%e5%8f%af%e8%a7%86%e5%8c%96\/\" class=\"tag-cloud-link tag-link-2 tag-link-position-3\" style=\"font-size: 8pt;\" aria-label=\"\u53ef\u89c6\u5316 (1\u4e2a\u9879\u76ee)\">\u53ef\u89c6\u5316<\/a>\n<a href=\"https:\/\/www.bihec.com\/idonus\/tag\/%e5%be%ae%e6%9c%ba%e7%94%b5%e7%b3%bb%e7%bb%9f%e5%88%b6%e9%80%a0%e8%ae%be%e5%a4%87\/\" class=\"tag-cloud-link tag-link-3 tag-link-position-4\" style=\"font-size: 14.322580645161pt;\" aria-label=\"\u5fae\u673a\u7535\u7cfb\u7edf\u5236\u9020\u8bbe\u5907 (9\u4e2a\u9879\u76ee)\">\u5fae\u673a\u7535\u7cfb\u7edf\u5236\u9020\u8bbe\u5907<\/a>\n<a href=\"https:\/\/www.bihec.com\/idonus\/tag\/%e5%be%ae%e7%94%b5%e5%ad%90%e6%9c%ba%e6%a2%b0%e7%b3%bb%e7%bb%9f%e5%88%b6%e9%80%a0%e8%ae%be%e5%a4%87\/\" class=\"tag-cloud-link tag-link-4 tag-link-position-5\" style=\"font-size: 14.683870967742pt;\" aria-label=\"\u5fae\u7535\u5b50\u673a\u68b0\u7cfb\u7edf\u5236\u9020\u8bbe\u5907 (10\u4e2a\u9879\u76ee)\">\u5fae\u7535\u5b50\u673a\u68b0\u7cfb\u7edf\u5236\u9020\u8bbe\u5907<\/a>\n<a href=\"https:\/\/www.bihec.com\/idonus\/tag\/%e6%99%b6%e5%9c%86%e9%94%ae%e5%90%88%e6%a3%80%e6%9f%a5%e8%a3%85%e7%bd%ae\/\" class=\"tag-cloud-link tag-link-5 tag-link-position-6\" style=\"font-size: 11.612903225806pt;\" aria-label=\"\u6676\u5706\u952e\u5408\u68c0\u67e5\u88c5\u7f6e (4\u4e2a\u9879\u76ee)\">\u6676\u5706\u952e\u5408\u68c0\u67e5\u88c5\u7f6e<\/a>\n<a href=\"https:\/\/www.bihec.com\/idonus\/tag\/%e6%99%b6%e5%9c%86%e9%94%ae%e5%90%88%e6%a3%80%e6%b5%8b%e6%9c%ba\/\" class=\"tag-cloud-link tag-link-6 tag-link-position-7\" style=\"font-size: 11.612903225806pt;\" aria-label=\"\u6676\u5706\u952e\u5408\u68c0\u6d4b\u673a (4\u4e2a\u9879\u76ee)\">\u6676\u5706\u952e\u5408\u68c0\u6d4b\u673a<\/a><\/div>","protected":false},"excerpt":{"rendered":"<p>Wafer bonding inspection device [pdfjs-viewer url=&#8221;https:\/\/www.bihec.com\/idonus\/wp-c <\/p>\n","protected":false},"author":14,"featured_media":96,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_vp_format_video_url":"","_vp_image_focal_point":[]},"categories":[3],"tags":[7,13,45,14,15,44,43],"_links":{"self":[{"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/posts\/84"}],"collection":[{"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/users\/14"}],"replies":[{"embeddable":true,"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/comments?post=84"}],"version-history":[{"count":2,"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/posts\/84\/revisions"}],"predecessor-version":[{"id":122,"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/posts\/84\/revisions\/122"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/media\/96"}],"wp:attachment":[{"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/media?parent=84"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/categories?post=84"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.bihec.com\/idonus\/wp-json\/wp\/v2\/tags?post=84"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}