美国DATARAY BeamMap2 – XYZθΦ 扫描狭缝光束分析仪
美国DATARAY 生产两种类型的扫描狭缝光束分析仪：BeamMap 系列，提供实时 M²、发散、聚焦和对准管理，以及 Beam’R 系列， 紧凑且精确的光束分析，所有的狭缝扫描光束分析仪均配备 Si、Ge 和 InGaAs 探测器，覆盖波长从 190 nm 到 2500 nm。
美国DATARAY BeamMap2 – XYZΘΦ Scanning Slit Beam Profiler
USB 2.0
Product ID: S-BMS2-4XY-Si-250
Features
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Multiple plane spacing options available
- Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode*
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 µm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Real-time multiple Z plane scanning slit system
- Real-time XYZ profiles, Focus position
- Real-time M², Divergence, Collimation, Alignment
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
- M² measurement with available M2DU stage
