美国DATARAY BMS2-CM4-Si-5光斑分析仪,光束轮廓分析仪
美国DATARAY 生产两种类型的扫描狭缝光束分析仪：BeamMap 系列，提供实时 M²、发散、聚焦和对准管理，以及 Beam’R 系列， 紧凑且精确的光束分析，所有的狭缝扫描光束分析仪均配备 Si、Ge 和 InGaAs 探测器，覆盖波长从 190 nm 到 2500 nm。
美国DATARAY Multiple Z-plane XYZΘΦ Scanning Slit System, 190 to 2500* nm
Port-powered USB 2.0
S-BMS2-CM4-Si-5
Features
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Beam diameters ~100 µm to ~3 mm (1.5 mm with extended InGaAs)
- 25 µm slit pairs with Si; 0.1 to 2 µm sampling intervals
- 50 µm slit pairs with InGaAs; 0.1 to 2 µm sampling intervals
- Real-time ±1 mr real-time Divergence and Pointing measurement accuracy
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 µm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Real-time multiple Z plane scanning slit system
- Real-time XYZ profiles, Focus position
- Real-time M², Divergence, Collimation, Alignment
Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
- M² measurement with available M2DU stage
* model-dependent
