MIS Inc. Olympus MX51 FMicroscope半导体显微镜 MIS-MX51F
Olympus MX51F Semiconductor Inspection Microscope
Olympus MX51F Semiconductor Inspection microscope,
complete to include: Super-Widefield Trinocular Head,
Long Working distance LMPLFL Plan Achromatic
Objectives, Brightfield and Darkfield Reflected Light Vertical
Illuminator, and 12v100w halogen light source. System
Features:
• Super-Widefield trinocular head, ergonomic tilting head
with 0 degree to 42 degree adjustment angle
• 10X/26.5mm Super-Widefield Eyepieces
• Large throat-depth stand with ergonomically positioned
focus knobs
• 100W Halogen Reflected Light Illumination with
Brightfield / Darkfield Vertical Illuminator and aperture
Adjustments
• Quintuple Motorized BF/DF Nosepiece with pendant
• LMPLFL 5x objective, 0.13 NA, 15mm working distance
• LMPLFL 10x objective, 0.25 NA, 10mm working distance
• LMPLFL 20x objective, 0.4 NA, 12mm working distance
• LMPLFL 50x objective, 0.5 NA, 10.6mm working distance
• LMPLFL 100x objective, 0.8 NA, 3.3mm working distance
• Interpupillary Distance 53-75mm
• Universal Input Power Supply, (90-240VAC 50/60HZ)
• Coaxial Fine and Coarse Adjustment with Tension
Control and Focus Stop
MIS Inc. Olympus MX51 FMicroscope半导体显微镜 MIS-MX51F
询价采购MIS Inc. Olympus MX51 FMicroscope半导体显微镜 MIS-MX51F
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