Beam Imaging 电子束观察系统 BOS-75-IW 荧光屏在真空测试中的应用

一种真空荧光屏的可靠性分析 作者:覃晓琼,师义民,李豪亮... 摘要:基于真空荧光屏(VFD)寿命服从对数正态分布的条件,本文在逐次定数截尾样本下研究了VFD的平均寿命、失效率和可靠度的点估计及其置信下限,并利用Monte-Carlo方法对估计结果的优劣进行了分析比较,验证了结论的正确性和可行性. 关键词:真空荧光屏 对数正态分布 逐次定数截尾 可靠性评估 平均寿命 置信下限 可靠度 点估计 极大似然估计 失效率 Beam Imaging Solutions (BIS) introduces the new 90-degree BOS which allows remote imaging of a beam at 90 degrees to the imaging plane. Like the BOS-18-IW and BOS-40-IW, the new BOS-75-IW can be attached to a linear motion feedthrough and placed into and out of the beam allowing for remote imaging, deep within the vacuum chamber. The imaging is accomplished by mounting a standard BOS MCP/phosphor screen stack onto a metal housing which has a mirror mounted at 90-degrees with respect to the imaging plane. The housing is wedged shaped to minimize the physical size of the imager, and has convenient points for attaching to a linear motion feedthrough. Electrical connections are made by attaching flexible electrically insulated wires to a connection block on the wedge from an electrical feedthrough. In their standard form, the BOS-IW units are available with the MCP/phosphor assembly mounted to wedge shaped housing with electrical connection block. BOS-IW kits are also available, and include the BOS-IW unit with electrical feedthrough, viewport, linear motion feedthrough and camera systems.

Imaging Area:
MCP: (Standard)
Phosphor Screen (Standard)
Construction Materials
Power Supply Requirements:
Beam Energy Range:
Beam Current Range:
Vacuum:

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