Silicon Drift Detector (SDD) Racetrack SDDs: For large solid angle in Microanalysis in TEM 用于TEM中的微分析中的大立体角

Silicon Drift Detector (SDD) Racetrack SDDs: For large solid angle in Microanalysis in TEM 用于TEM中的微分析中的大立体角 There is a limitation if only the active area of the SDD is increased. Therefore PNDetector invented the so called Racetrack chip structure. These SDDs make use of an oval shaped active area. Therefore, they can be placed extremely close to the sample even in applications where the available space is restricted. This leads to largely increased solid angles. 如果仅增加SDD的活动区域，则存在限制。因此PNDetector发明了Racetrack芯片结构。这些SDD利用了一个椭圆形的活动区域。因此，即使在可用空间有限的应用中，它们也可以放置在离样品非常近的位置。这导致立体角大大增加。

The Specific Oval Shaped SDD Series named Racetrack

High resolution spectroscopy down to 126 eV @ Mn Kα, -30 °C
Extreme close proximity to the sample with solid angles exceeding 1 sr
Huge solid angles up to 2 sr are possible with dual configurations in TEM
Mounted on a compact housing comprising non-magnetic materials
Mostly used in “windowless” configuration – gives the highest detection efficiency for light elements

特殊的椭圆形SDD系列Racetrack 在Mn Kα，-30°C时，高分辨率光谱低至126 eV 与立体角超过1 sr的样品极为接近在TEM中使用双配置可以获得高达2sr的巨大立体角安装在由非磁性材料组成的紧凑型外壳上主要用于“无窗”配置–为光元件提供最高的检测效率

询价采购Silicon Drift Detector (SDD) Racetrack SDDs: For large solid angle in Microanalysis in TEM 用于TEM中的微分析中的大立体角

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